Course Number:

Credit Hours:

4

Course Title:

CAD for Design and Test

Course Description:

Addresses the principles of the algorithms and approaches for VLSI design and test automation. Briefly covers basic data structures and graph algorithms typically used for computer-aided design (CAD) as well as general-purpose methods for combinatorial optimization, such as backtracking, branch-and-bound, simulated annealing, and genetic algorithms. Design automation topics include physical design automation (partitioning, floor planning, placement, global and detailed routing, cell generation, and layout compaction), and high-level synthesis (scheduling, resource allocation). Testing topics include an overview of fault modeling, automatic test pattern generation, design for testability, and built-in self test (BIST). Course involves some programming assignments (implementation of some of the algorithms covered in class) as well as using state-of-the-art CAD tools in the design flow.